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application
1. suitable for high and low temperature suitability test, low temperature keeping and storage of electronic, electrical products, instruments and meters, raw material, and electronic components.
2. especially used for high and low temperature suitability test of optical fiber, crystal, precise inductor, pcb and lcd.
standards implemented and met
1. gb/t10589-1989 technical conditions of low temperature test chamber
2. gb/t11158-1989 technical conditions of high temperature test
3. gb/t10592-1989 technical conditions of high and low temperature test chamber
4. gb/t2423.1-2001 iec60068-2-1 regulations of test a: test method of low temperature test
5. gb/t2423.2-1989 iec60068-2-2 regulations of test b: test method of high temperature test
6. gb/t2423.22-1987 test nb test method of temperature change
7. gjb150.3-1986 high temperature test
8. gjb150.4-1986 low temperature test
9. iec68-2-14 test n
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